Dimension Edge 扫描探针显微镜系统（Veeco Intro
|制造商：Bruker Nano Inc|
|规格参数：X-Y scan range: 90μm x 90μm typical, 85μm minimum Z range: 10μm typical in imaging and force ramp modes, 9.5μm minimum Vertical noise floor <50pm RMS in appropriate environment, typical imaging bandwidth (up to 625Hz) XY position noise (closed loop) <0.5nm RMS typical imaging bandwidth (up to 625Hz) Z position sensor noise level (closed loop): <0.2nm RMS typical imaging bandwidth (up to 625Hz) Sample size/holder: 150mm vacuum chuck, 15mm thick; up to 40mm thick with optional frame spacer|
The Dimension® Edge™ Atomic Force Microscope (AFM) System incorporates Veeco’s latest technology advances to provide the highest levels of performance, functionality, and accessibility in its class. Based on the ultimate Dimension Icon® platform, the Edge System has been designed from top to bottom to deliver the low drift and low noise necessary to achieve publication-ready data in minutes instead of hours, all at price points well below expectations for such performance. In addition, integrated visual feedback and preconfigured settings enable expert-level results simply and consistently, making the most advanced large-sample atomic force microscopy capabilities and techniques available to every facility and user.